• DocumentCode
    2525139
  • Title

    Diagnostic techniques for the UltraSPARCTM microprocessors

  • Author

    Kinra, Anjali ; Mehta, Aswin ; Smith, Neal ; Mitchell, Jackie ; Valente, Fred

  • Author_Institution
    Texas Instrum. Inc., TX, USA
  • fYear
    1998
  • fDate
    18-23 Oct 1998
  • Firstpage
    480
  • Lastpage
    486
  • Abstract
    Successful manufacturing ramp of a complex high speed microprocessor requires quick and reliable test and diagnostic methods. Some commonly used debug techniques for the UltraSPARC family of devices are presented with actual result of some diagnosed failures
  • Keywords
    automatic test pattern generation; boundary scan testing; computer debugging; design for testability; fault diagnosis; integrated circuit testing; logic testing; microprocessor chips; production testing; ATPG; DFT; Fastscan; RAMTEST port; UltraSPARC microprocessors; boundary scan chain; complex high speed microprocessor; critical path debug; debug techniques; defect mapping; diagnostic techniques; embedded memory arrays; failure diagnosis; logic diagnosis; production testing; CMOS process; Frequency; Logic testing; Manufacturing; Microprocessors; Packaging; Pins; Random access memory; Read-write memory; Signal design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1998. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-5093-6
  • Type

    conf

  • DOI
    10.1109/TEST.1998.743189
  • Filename
    743189
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2525139