Title :
Diagnostic techniques for the UltraSPARCTM microprocessors
Author :
Kinra, Anjali ; Mehta, Aswin ; Smith, Neal ; Mitchell, Jackie ; Valente, Fred
Author_Institution :
Texas Instrum. Inc., TX, USA
Abstract :
Successful manufacturing ramp of a complex high speed microprocessor requires quick and reliable test and diagnostic methods. Some commonly used debug techniques for the UltraSPARC family of devices are presented with actual result of some diagnosed failures
Keywords :
automatic test pattern generation; boundary scan testing; computer debugging; design for testability; fault diagnosis; integrated circuit testing; logic testing; microprocessor chips; production testing; ATPG; DFT; Fastscan; RAMTEST port; UltraSPARC microprocessors; boundary scan chain; complex high speed microprocessor; critical path debug; debug techniques; defect mapping; diagnostic techniques; embedded memory arrays; failure diagnosis; logic diagnosis; production testing; CMOS process; Frequency; Logic testing; Manufacturing; Microprocessors; Packaging; Pins; Random access memory; Read-write memory; Signal design;
Conference_Titel :
Test Conference, 1998. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5093-6
DOI :
10.1109/TEST.1998.743189
