DocumentCode :
2525203
Title :
18 ps ECL-gate delay in laterally scaled 30 GHz bipolar transistors
Author :
Pruijmboom, A. ; Timmering, C.E. ; Hageraats, J.J.E.M.
Author_Institution :
Philips Res. Lab., Eindhoven, Netherlands
fYear :
1994
fDate :
11-14 Dec. 1994
Firstpage :
825
Lastpage :
828
Abstract :
ECL-gate delays as low as 18 ps have been achieved in conventional bipolar technology, with a cut-off frequency f/sub T/ of 30 GHz. Rather than optimizing vertical doping profiles for maximum f/sub T/, the transistors were optimized for high-speed circuit performance by reducing device parasitics. This simplifies their integration in BICMOS processes and, since lower f/sub T/s are achieved at lower current densities, allows a decreased power consumption for high-speed circuits. In this transistor technology a DC-coupled broad-band amplifier (BBA), with a record bandwidth of 11.7 GHz for 15 Gbit/s optical data links has been fabricated.<>
Keywords :
BiCMOS integrated circuits; current density; delays; doping profiles; microwave bipolar transistors; semiconductor technology; 11.7 GHz; 15 Gbit/s; 15 Gbit/s optical data links; 18 ps; 30 GHz; 30 GHz bipolar transistors; BICMOS processes; DC-coupled broad-band amplifier; ECL-gate delay; conventional bipolar technology; cut-off frequency; device parasitics; high-speed circuit performance; high-speed circuits; laterally scaled; lower current densities; microwave transistors; power consumption; record bandwidth; transistor technology; vertical doping profiles; BiCMOS integrated circuits; Bipolar transistors; Circuit optimization; Current density; Cutoff frequency; Delay; Doping profiles; Energy consumption; Optical amplifiers; Semiconductor optical amplifiers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1994. IEDM '94. Technical Digest., International
Conference_Location :
San Francisco, CA, USA
ISSN :
0163-1918
Print_ISBN :
0-7803-2111-1
Type :
conf
DOI :
10.1109/IEDM.1994.383297
Filename :
383297
Link To Document :
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