Title :
High temperature performance of flexible SOI FinFETs with sub-20 nm fins
Author :
Diab, A. ; Torres Sevilla, G.A. ; Ghoneim, M.T. ; Hussain, M.M.
Author_Institution :
Integrated Nanotechnol. Lab., King Abdullah Univ. of Sci. & Technol., Thuwal, Saudi Arabia
Abstract :
We demonstrate a flexible version of the semiconductor industry´s most advanced transistor topology - FinFET on silicon-on-insulator (SOI) with sub-20 nm fins and high-κ/metal gate stacks. This is the most advanced flexible (0.5 mm bending radius) transistor on SOI ever demonstrated for exciting opportunities in high performance flexible electronics with stylish product design. For the first time, we characterize such device from room to high temperature (150 °C). And we discuss the dependence of the I-V curves with temperature.
Keywords :
MOSFET; flexible electronics; silicon-on-insulator; I-V curves; flexible SOI FinFETs; flexible transistor; high temperature performance; high-κ-metal gate stacks; silicon-on-insulator; size 20 nm; temperature 20 degC to 150 degC; temperature 293 K to 298 K; FinFETs; Flexible electronics; Logic gates; Metals; Performance evaluation; Temperature; Temperature measurement;
Conference_Titel :
SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2014 IEEE
Conference_Location :
Millbrae, CA
DOI :
10.1109/S3S.2014.7028211