• DocumentCode
    252542
  • Title

    High temperature performance of flexible SOI FinFETs with sub-20 nm fins

  • Author

    Diab, A. ; Torres Sevilla, G.A. ; Ghoneim, M.T. ; Hussain, M.M.

  • Author_Institution
    Integrated Nanotechnol. Lab., King Abdullah Univ. of Sci. & Technol., Thuwal, Saudi Arabia
  • fYear
    2014
  • fDate
    6-9 Oct. 2014
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We demonstrate a flexible version of the semiconductor industry´s most advanced transistor topology - FinFET on silicon-on-insulator (SOI) with sub-20 nm fins and high-κ/metal gate stacks. This is the most advanced flexible (0.5 mm bending radius) transistor on SOI ever demonstrated for exciting opportunities in high performance flexible electronics with stylish product design. For the first time, we characterize such device from room to high temperature (150 °C). And we discuss the dependence of the I-V curves with temperature.
  • Keywords
    MOSFET; flexible electronics; silicon-on-insulator; I-V curves; flexible SOI FinFETs; flexible transistor; high temperature performance; high-κ-metal gate stacks; silicon-on-insulator; size 20 nm; temperature 20 degC to 150 degC; temperature 293 K to 298 K; FinFETs; Flexible electronics; Logic gates; Metals; Performance evaluation; Temperature; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2014 IEEE
  • Conference_Location
    Millbrae, CA
  • Type

    conf

  • DOI
    10.1109/S3S.2014.7028211
  • Filename
    7028211