DocumentCode
2525507
Title
Testing the design: the evolution of test simulation
Author
Force, Craig ; Austin, Tom
Author_Institution
Texas Instrum. Inc., Dallas, TX, USA
fYear
1998
fDate
18-23 Oct 1998
Firstpage
612
Lastpage
621
Abstract
In work done in cooperation with Texas Instruments, Analogy, and Teradyne it has been demonstrated that a simulation of a complete test system when combined with design models of an integrated circuit can reduce the cycle time required to get a new product to market. This paper will describe the development of such a system, its inclusion in the design flow for new IC development, and the resulting improvements in new product introduction from the viewpoint of design and test
Keywords
automatic testing; circuit simulation; design for testability; digital simulation; integrated circuit testing; Analogy; IC testing; Teradyne; Texas Instruments; cycle time; design models; integrated circuit; simulation; test simulation; Automatic testing; Circuit simulation; Circuit testing; Data engineering; Design engineering; Engines; Instruments; Integrated circuit testing; Signal design; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1998. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-5093-6
Type
conf
DOI
10.1109/TEST.1998.743205
Filename
743205
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