Title :
Defect-oriented testing of mixed-signal ICs: some industrial experience
Author_Institution :
Philips Semicond., Nijmegen, Netherlands
Abstract :
Some of Philips´ industrial experience are presented in this paper on defect-oriented testing of mixed-signal ICs. Case studies on analog circuit blocks in two automotive mixed-signal ICs are described. This is done to demonstrate the potential of the defect-oriented testing approach in the industrial test development for test coverage improvement with simple industrial tests. It has been shown that, in addition to the conventional function-oriented tests, the test coverage of bridging faults can be significantly improved by some simple tests derived by using the defect-oriented testing approach
Keywords :
CMOS integrated circuits; analogue integrated circuits; automotive electronics; fault diagnosis; integrated circuit testing; mixed analogue-digital integrated circuits; production testing; CAN protocol; IDDQ test; Philips; air bag control; analog circuit; automotive IC; bridging faults; defect-oriented testing; fault masking; industrial test; mixed-signal IC; test coverage; wafer yield; Analog circuits; Automatic testing; Automotive engineering; Circuit faults; Circuit testing; Costs; Digital integrated circuits; Integrated circuit testing; Semiconductor device testing; System testing;
Conference_Titel :
Test Conference, 1998. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5093-6
DOI :
10.1109/TEST.1998.743212
