Title :
OxRAM-based pulsed latch for non-volatile flip-flop in 28nm FDSOI
Author :
Levisse, A. ; Jovanovic, N. ; Vianello, E. ; Portal, J.-M. ; Thomas, O.
Author_Institution :
Univ. Grenoble Alpes, Grenoble, France
Abstract :
Emerging connected devices operating on battery or harvested energy sources highlight the need for ultra-low standby power design. Including non-volatility in flip-flops (FF) allows nullifying the power consumption in sleep mode, while maintaining the system state. Most of the reported solutions require FF modifications while increasing their complexity. This paper presents a non-volatile flip-flop (NVFF) designed as an OxRAM-based pulsed latch tied to a regular FF for ultra-wide voltage range applications. In 28nm CMOS FDSOI, adding non-volatility cut-off the FF leakage at the cost of 63pJ of data store and restore energy and less than 15% of delay penalty.
Keywords :
CMOS memory circuits; flip-flops; low-power electronics; resistive RAM; silicon-on-insulator; CMOS FDSOI; OxRAM-based pulsed latch; nonvolatile flip-flop; oxide-based ReRAM technology; size 28 nm; ultralow standby power design; ultrawide voltage range applications; CMOS integrated circuits; Computer architecture; Delays; Flip-flops; Latches; Nonvolatile memory; Switches;
Conference_Titel :
SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2014 IEEE
Conference_Location :
Millbrae, CA
DOI :
10.1109/S3S.2014.7028226