Title :
Low energy electron technology study
Author :
Yuan, Xiao-Qing ; Shi, Yi-Kai ; Jian-Hui, Dang
Author_Institution :
Sch. of Mechatron., Northwestern Polytech. Univ., Xi´´an, China
Abstract :
A brief general introduction to a novel low energy electron-exoelectron was given. Various emission methods of induced solid were involved. More detailed consideration was given to these following topics: classification of exoelectron emission mechanisms; emission models of exoelectron; applications of exoelectron; the application of metal micro-crack predicting by low energy electron technology was especially described; and finally many issues demanding prompt solution for low energy electron technology were proposed.
Keywords :
Auger effect; exoelectron emission; low energy electron diffraction; microcracks; emission methods; emission models; exoelectron emission mechanisms; induced solid; low energy electron technology study; metal microcrack; novel low energy electron-exoelectron; Automatic repeat request; Biomedical measurements; Auger emission; exoelectron emission; mechanism; model;
Conference_Titel :
Mechanical and Electrical Technology (ICMET), 2010 2nd International Conference on
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-8100-2
Electronic_ISBN :
978-1-4244-8102-6
DOI :
10.1109/ICMET.2010.5598463
