Title :
More than an order of magnitude energy improvement of FPGA by combining 0.4V operation and Multi-Vt optimization of 20k body bias domains
Author :
Koike, H. ; Chao Ma ; Hioki, M. ; Ogasahara, Y. ; Tsutsumi, T. ; Nakagawa, T. ; Sekigawa, T.
Author_Institution :
Nat. Inst., AIST, Tsukuba, Japan
Abstract :
In this paper, more than an order of magnitude (1/13) energy improvement of FPGA by combining low voltage operation and fine-grained body bias optimization is demonstrated from the measurement of the new SOTB implementation of Flex Power FPGA test chip.
Keywords :
field programmable gate arrays; silicon-on-insulator; SOTB; field programmable gate array; fine-grained body bias domain optimization; flex power FPGA test chip; magnitude energy improvement; multi-Vt optimization; silicon on thin buried oxide; voltage 0.4 V; Field programmable gate arrays; Flexible printed circuits; Frequency measurement; Low voltage; Optimization; Semiconductor device measurement;
Conference_Titel :
SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), 2014 IEEE
Conference_Location :
Millbrae, CA
DOI :
10.1109/S3S.2014.7028240
