DocumentCode :
2526111
Title :
Aging characteristics and mechanisms of ZnO nonlinear varistors
Author :
He, Jin-Liang ; Zeng, Rong ; Tu, You-Ping ; Han, Se-Won ; Cho, Han-Goo
Author_Institution :
Dept. of Electr. Eng., Tsinghua Univ., Beijing, China
Volume :
2
fYear :
2000
fDate :
2000
Firstpage :
790
Abstract :
The aging threatens the operation stability of ZnO nonlinear varistors. Ordinary, the aging characteristics of ZnO varistors is measured by the power loss changing with time. Analyzing a lot of experimental results, we observed the characteristics of power losses of ZnO varistors can be classified into three types according to applied experimental temperature and applied voltage: (1) the power loss steeply rises with the time and leads to thermal breakdown, when ZnO varistor has a bad performance; (2) the power loss first quickly rises with the time, and then slowly increases with the time, and at last sharply rises with the time and leads to thermal breakdown; (3) the power loss first rises with the time, and then decreases and slowly reaches a stable value with the time. The aging mechanisms for three different aging types of ZnO varistors were discussed based on the changing of Schottky barrier and the migration of zinc interstitials inside ZnO grains, and heat treatment effect
Keywords :
II-VI semiconductors; ageing; varistors; zinc compounds; Schottky barrier; Zn interstitials migration; ZnO; ZnO nonlinear varistors; aging characteristics; aging mechanisms; mechanisms; operation stability; power loss; thermal breakdown; Aging; Breakdown voltage; Loss measurement; Performance analysis; Power measurement; Stability; Temperature; Time measurement; Varistors; Zinc oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Properties and Applications of Dielectric Materials, 2000. Proceedings of the 6th International Conference on
Conference_Location :
Xi´an
Print_ISBN :
0-7803-5459-1
Type :
conf
DOI :
10.1109/ICPADM.2000.876348
Filename :
876348
Link To Document :
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