DocumentCode :
2526122
Title :
Instrumentation and calibration for a miniature RF E-field probe
Author :
Ng, K.T. ; Batchman, T.E. ; Pavlica, S. ; Veasey, D.L.
Author_Institution :
Dept. of Electr. Eng., Virginia Univ., Charlottesville, VA, USA
fYear :
1988
fDate :
20-22 Apr 1988
Firstpage :
11
Lastpage :
15
Abstract :
An amplification system for a miniature field probe is described and a complete noise analysis of the probe amplification system is presented. Unlike previous studies, this analysis does not assume that the amplifier is ideal and noiseless with an infinite input impedance. Theoretical findings are verified with experimental results. A simple calibration procedure using an X-band slotted waveguide is presented that uses less power and space than conventional techniques requiring antenna measurements in an anechoic chamber. Measurement results show a relatively small field perturbation due to the probe and a region in the waveguide where the field is relatively uniform and suitable for calibration
Keywords :
calibration; field strength measurement; microwave measurement; probes; waveguides; X-band slotted waveguide; antenna measurements; calibration; field perturbation; miniature RF E-field probe; noise analysis; probe amplification; Antenna measurements; Calibration; Extraterrestrial measurements; Impedance; Instruments; Power measurement; Probes; Radio frequency; Radiofrequency amplifiers; Slot antennas;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1988. IMTC-88. Conference Record., 5th IEEE
Conference_Location :
San Diego, CA
Type :
conf
DOI :
10.1109/IMTC.1988.10809
Filename :
10809
Link To Document :
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