DocumentCode :
2526265
Title :
Test schemes for master station of distribution automation systems
Author :
Xu, Yinghui ; Xu, Xiaohui
Author_Institution :
Sch. of Autom., Guangdong Univ. of Technol., Guangzhou
fYear :
2008
fDate :
19-21 Nov. 2008
Firstpage :
1
Lastpage :
4
Abstract :
Schemes are presented to implement FAT (factory accept test) of the master station of DAS (distribution automation system), test configuration contains emulated distribution network, test environment and test software, two types of test environments including total software scheme and software-hardware combined scheme are analyzed, and then generalize the conditions for automatic test. The implementation schemes of manual test and automatic test are analyzed in detail for the typical fault situations of feeder automation, and also include several kinds of special faults such as: telecontrol triggering fault, concurrent multi-faults, multi-sources fault, etc. Reliability tests make up of three aspects: 1) long-term continuous running under typically normal condition; 2) continuous automatic telecontrol with short period; 3) data avalanche test. The importance is analyzed for automatic test software performing long-term continuous test and result logging according to developmental and practical situation, and generalize the required time duration and data volume for presented test schemes.
Keywords :
automatic test software; automation; distribution networks; reliability; concurrent multifaults; distribution automation systems; feeder automation; multisource fault; reliability test; software-hardware scheme; telecontrol triggering fault; total software scheme; Automatic testing; Automation; Optical character recognition software; Paramagnetic resonance; System testing; Virtual reality; All software scheme; continuous automatic test; data avalanche; emulated field terminal unit (FTU); emulation distribution network; factory accept test (FAT); fault indication (FI); feeder automation; software-hardware mixed scheme; three-phase power source;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
TENCON 2008 - 2008 IEEE Region 10 Conference
Conference_Location :
Hyderabad
Print_ISBN :
978-1-4244-2408-5
Electronic_ISBN :
978-1-4244-2409-2
Type :
conf
DOI :
10.1109/TENCON.2008.4766500
Filename :
4766500
Link To Document :
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