DocumentCode
2526350
Title
The slow relaxation of capacitance in ferroelectric devices under electrical pulse influence
Author
Tumarkin, A.V. ; Razumov, S.V. ; Gagarin, A.G. ; Gaidukov, M.M. ; Kozyrev, A.B.
Author_Institution
St. Petersburg Electrotech. Univ., St. Petersburg
fYear
2007
fDate
8-10 Oct. 2007
Firstpage
477
Lastpage
480
Abstract
The influence of technology parameters and construction of ferroelectric capacitors on capacitance relaxation mechanisms in BaxSr1-xTiO3 (BSTO) varactors prepared by ion-plasma deposition technique has been investigated. The slow relaxation phenomenon (10divide100 s) in ferroelectric elements in paraelectric state can be explained by the presence of space charge localized on trapping defects in high defected interface layer electrode-ferroelectric.
Keywords
barium compounds; capacitance; ferroelectric capacitors; strontium compounds; titanium compounds; varactors; BSTO varactors; capacitance slow relaxation; electrical pulse influence; ferroelectric capacitors; ferroelectric devices; ion-plasma deposition technique; Capacitance measurement; Capacitors; Charge carriers; Electrodes; Ferroelectric devices; Ferroelectric materials; Polarization; Pulse measurements; Space charge; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Integrated Circuit Conference, 2007. EuMIC 2007. European
Conference_Location
Munich
Print_ISBN
978-2-87487-002-6
Type
conf
DOI
10.1109/EMICC.2007.4412753
Filename
4412753
Link To Document