• DocumentCode
    2526359
  • Title

    Disruption and damage of an electrooptic modulator by pulsed microwaves

  • Author

    Schermer, Ross T ; Bucholtz, Frank ; Villarruel, Carl A ; Gil, Jesus Gil ; Andreadis, Tim D. ; Williams, Keith J.

  • Author_Institution
    U.S. Naval Res. Lab., Washington, DC, USA
  • fYear
    2009
  • fDate
    22-24 Sept. 2009
  • Firstpage
    13
  • Lastpage
    14
  • Abstract
    These results demonstrate the ability of a commercial LiNbO3 EO modulator to withstand damage from direct pulsed RF input up to 200 W. However, short-term disruption occurred at a few Watts, which suggests a need for improved modulator thermal design.
  • Keywords
    electric breakdown; electro-optical modulation; lithium compounds; microwave photonics; LiNbO3; damage threshold; dielectric breakdown; direct pulsed RF input; electrooptic modulator; modulator thermal design; power 200 W; pulsed microwaves; short-term disruption; Electrodes; Electrooptic modulators; Optical modulation; Optical pulses; Optical receivers; Pulse amplifiers; Pulse modulation; Pulse width modulation; Radio frequency; Space vector pulse width modulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Avionics, Fiber-Optics and Phototonics Technology Conference, 2009. AVFOP '09. IEEE
  • Conference_Location
    San Antonio, TX
  • Print_ISBN
    978-1-4244-3358-2
  • Type

    conf

  • DOI
    10.1109/AVFOP.2009.5342719
  • Filename
    5342719
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2526359