Title :
Disruption and damage of an electrooptic modulator by pulsed microwaves
Author :
Schermer, Ross T ; Bucholtz, Frank ; Villarruel, Carl A ; Gil, Jesus Gil ; Andreadis, Tim D. ; Williams, Keith J.
Author_Institution :
U.S. Naval Res. Lab., Washington, DC, USA
Abstract :
These results demonstrate the ability of a commercial LiNbO3 EO modulator to withstand damage from direct pulsed RF input up to 200 W. However, short-term disruption occurred at a few Watts, which suggests a need for improved modulator thermal design.
Keywords :
electric breakdown; electro-optical modulation; lithium compounds; microwave photonics; LiNbO3; damage threshold; dielectric breakdown; direct pulsed RF input; electrooptic modulator; modulator thermal design; power 200 W; pulsed microwaves; short-term disruption; Electrodes; Electrooptic modulators; Optical modulation; Optical pulses; Optical receivers; Pulse amplifiers; Pulse modulation; Pulse width modulation; Radio frequency; Space vector pulse width modulation;
Conference_Titel :
Avionics, Fiber-Optics and Phototonics Technology Conference, 2009. AVFOP '09. IEEE
Conference_Location :
San Antonio, TX
Print_ISBN :
978-1-4244-3358-2
DOI :
10.1109/AVFOP.2009.5342719
