Title :
On applying non-classical defect models to automated diagnosis
Author :
Saxena, Jayashree ; Butler, Kenneth M. ; Balachandran, Hari ; Lavo, David B. ; Chess, Brian ; Larrabee, Tracy ; Ferguson, F. Joel
Author_Institution :
Texas Instrum. Inc., Dallas, TX, USA
Abstract :
Automated fault diagnosis based on the stuck-at fault model is not always effective. This paper presents practical experiences in applying a bridging fault based diagnosis technique to a TI ASIC design. Results are presented for units into which known bridging defects have been introduced via a focused ion beam (FIB) machine
Keywords :
application specific integrated circuits; automatic testing; fault diagnosis; integrated circuit testing; logic testing; TI ASIC design; automated fault diagnosis; bridging defects; bridging fault; focused ion beam machine; nonclassical defect models; stuck-at fault model; Circuit faults; Debugging; Electron microscopy; Fault diagnosis; Instruments; Manufacturing industries; Monolithic integrated circuits; Optical microscopy; Silicon; System testing;
Conference_Titel :
Test Conference, 1998. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5093-6
DOI :
10.1109/TEST.1998.743256
