DocumentCode
2526682
Title
Correlations between path delays and the accuracy of performance prediction
Author
Huisman, Leendert M.
Author_Institution
IBM Corp., Essex Junction, VT, USA
fYear
1998
fDate
18-23 Oct 1998
Firstpage
801
Lastpage
808
Abstract
The correlation between the delays of various types of paths on an Integrated Circuit (IC) is studied. The correlation between delays of different critical paths is found to be low. An estimate is made of the correlation between the maximum frequency at which the IC can operate and the delay of some specific path on it. This correlation improves as the number of critical and near critical path increases, but will never be perfect
Keywords
application specific integrated circuits; automatic testing; boundary scan testing; delays; integrated circuit testing; logic testing; ASIC parts; critical paths; flush delays; integrated circuit; maximum frequency; path delays; performance prediction accuracy; ring oscillators; scan paths; single-path delay; statistical analysis; Accuracy; Chemicals; Circuits; Constitution; Delay effects; Fluctuations; Frequency measurement; Microelectronics; Semiconductor device measurement; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1998. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-5093-6
Type
conf
DOI
10.1109/TEST.1998.743264
Filename
743264
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