Title :
Correlations between path delays and the accuracy of performance prediction
Author :
Huisman, Leendert M.
Author_Institution :
IBM Corp., Essex Junction, VT, USA
Abstract :
The correlation between the delays of various types of paths on an Integrated Circuit (IC) is studied. The correlation between delays of different critical paths is found to be low. An estimate is made of the correlation between the maximum frequency at which the IC can operate and the delay of some specific path on it. This correlation improves as the number of critical and near critical path increases, but will never be perfect
Keywords :
application specific integrated circuits; automatic testing; boundary scan testing; delays; integrated circuit testing; logic testing; ASIC parts; critical paths; flush delays; integrated circuit; maximum frequency; path delays; performance prediction accuracy; ring oscillators; scan paths; single-path delay; statistical analysis; Accuracy; Chemicals; Circuits; Constitution; Delay effects; Fluctuations; Frequency measurement; Microelectronics; Semiconductor device measurement; Wires;
Conference_Titel :
Test Conference, 1998. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5093-6
DOI :
10.1109/TEST.1998.743264
