Title :
High speed testing-have the laws of physics finally caught up with us?
Author_Institution :
Res. & Dev., Advantest Inc., Santa Clara, CA, USA
Abstract :
While tester speeds increase beyond 1 GHz, their use is limited by Round Trip Delay (RTD) to around 300 MHz. This paper describes RTD, explores the problems it presents, and discusses one known solution to this problem. It also introduces a new tester architecture that directly addresses these issues
Keywords :
automatic test equipment; automatic testing; delays; integrated circuit testing; ATE; high speed testing; round trip delay; tester architecture; Contacts; Delay; Electronic equipment testing; FETs; Frequency; Lithography; Physics; Power generation; Research and development; Switches;
Conference_Titel :
Test Conference, 1998. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5093-6
DOI :
10.1109/TEST.1998.743265
