DocumentCode
25268
Title
Subcycle Voltage Dip Classification Using Matrix Pencil Method With Ellipse Fitting Algorithm
Author
Meng Hwee Chia ; Khambadkone, Ashwin M.
Author_Institution
Exp. Power Grid Centre, Agency for Sci., Technol. & Res. (A*STAR), Singapore, Singapore
Volume
51
Issue
2
fYear
2015
fDate
March-April 2015
Firstpage
1660
Lastpage
1668
Abstract
We have developed a technique using the matrix pencil method (MPM), which was augmented with an ellipse fitting algorithm, that can classify three-phase voltage dips only using subcycle voltage data. This technique uses the MPM to extract the fundamental frequency components and reconstructs the fundamental voltage space vector that often changes into an ellipse during a fault. This ellipse´s parameters are then estimated by an ellipse fitting algorithm to classify the dip. We have demonstrated that this technique can differentiate between highly distorted and similar voltage dips only using a quarter-cycle of data, which is equivalent to 5 ms in a 50-Hz alternating-current system. This method is further improved by prefiltering and downsampling the data to reduce the computation time and is implemented on a National Instruments CompactRIO platform. This system classified the dip in real time at about 10-12 ms after fault detection when tested with reproduced fault voltage waveforms amplified to a voltage level of 415 V. Our method thus executes faster than the conventional method of the fast Fourier transform that requires at least a full fundamental cycle time of 20 ms. This technique serves as a method of analyzing subcycle voltage dip phenomena and can be potentially extended to other fast subcycle electrical events.
Keywords
fault diagnosis; matrix algebra; power supply quality; vectors; MPM; National Instruments CompactRIO platform; alternating-current system; data downsampling; data prefiltering; ellipse fitting algorithm; fault detection; fault voltage waveforms; frequency 50 Hz; fundamental frequency components; fundamental voltage space vector; matrix pencil method; subcycle electrical events; subcycle voltage dip classification; three-phase voltage dips; time 5 ms; voltage 415 V; Boolean functions; Data structures; Equations; Mathematical model; Support vector machine classification; Vectors; Voltage fluctuations; Ellipse fitting; fault classification; matrix pencil method (MPM); power quality monitoring; space vector; voltage dips;
fLanguage
English
Journal_Title
Industry Applications, IEEE Transactions on
Publisher
ieee
ISSN
0093-9994
Type
jour
DOI
10.1109/TIA.2014.2347455
Filename
6877668
Link To Document