Title :
A comparative evaluation of some practical algorithms used in the equivalent bits test of waveform recorders
Author :
McComb, T.R. ; Kuffel, J. ; Leroux, B.
Author_Institution :
NRC, Ottawa, Ont., Canada
Abstract :
A comparative evaluation of three basic algorithms that are used in the equivalent-bit test in digital recorders is presented. The algorithms are used to calculate the parameters of a pure sinusoid which has been digitally recorded. The basic algorithms and their variations are evaluated with regards to relative and absolute accuracy as well as efficiency. Various methods of obtaining the initial estimates of the sine wave parameters are examined. The advantages, disadvantages and effects of the techniques used to arrive at these estimates are discussed and optimum methods are suggested. The work is intended to lead to the specification of a general best-fit algorithm to be used in sine-wave evaluation of digital recorders
Keywords :
automatic test equipment; computerised signal processing; digital instrumentation; electronic equipment testing; recorders; wave analysers; ATE; best-fit algorithm; comparative evaluation; computerised signal processing; digital recorders; equivalent bits test; optimum methods; pure sinusoid; sine wave parameters; waveform recorders; IEEE members; Impulse testing; Instrumentation and measurement; Instruments; Laboratories; Least squares methods; Measurement errors; Parameter estimation; Taylor series; Voltage;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1988. IMTC-88. Conference Record., 5th IEEE
Conference_Location :
San Diego, CA
DOI :
10.1109/IMTC.1988.10853
