• DocumentCode
    2526870
  • Title

    Sinewave parameter estimation algorithm with application to waveform digitizer effective bits measurement

  • Author

    Jenq, Y.C. ; Crosby, Phil

  • Author_Institution
    Tektronix Inc., Beaverton, OR, USA
  • fYear
    1988
  • fDate
    20-22 Apr 1988
  • Firstpage
    218
  • Lastpage
    221
  • Abstract
    A high-performance algorithm to estimate the four parameters (amplitude, DC offset, frequency and phase) of a sine wave from a sampled data record is presented. The estimation errors are obtained in closed form and can be controlled. The algorithm is non iterative and extremely fast. A Turbo Pascal implementation on the IBM PC/AT requires only a couple of seconds to do a 256-point fit. A method to measure a digitizer´s effective bits using this algorithm is presented. Simulation results indicate that the method gives excellent estimates of the true resolution of the simulated ideal digitizer. A 10-point effective-bits plot of a waveform digitizer under test can be accomplished in seconds instead of minutes or even hours as with other iterative algorithms
  • Keywords
    analogue-digital conversion; computerised signal processing; digital simulation; electronic equipment testing; parameter estimation; waveform analysis; DC offset; IBM PC/AT; Turbo Pascal; amplitude; curve fitting; effective bits measurement; estimation errors; frequency; high-performance algorithm; phase; simulated ideal digitizer; sinewave parameter estimation; waveform digitizer; Amplitude estimation; Circuit testing; Coupling circuits; Estimation error; Frequency estimation; Frequency shift keying; Iterative algorithms; Linear circuits; Parameter estimation; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1988. IMTC-88. Conference Record., 5th IEEE
  • Conference_Location
    San Diego, CA
  • Type

    conf

  • DOI
    10.1109/IMTC.1988.10854
  • Filename
    10854