DocumentCode :
2526997
Title :
Defect level prediction for IDDQ testing
Author :
Okuda, Yukio ; Kubota, Isao ; Watanabe, Masahiro
Author_Institution :
Dept. of Design Autom., Sony Corp., Atsugi, Japan
fYear :
1998
fDate :
18-23 Oct 1998
Firstpage :
900
Lastpage :
909
Abstract :
A problem with IDDQ testing is its inability to predict defect level. This paper classifies defects detected by IDDQ testing into two categories: those that can be modeled by stuck-at-fault (SAF) model and those that can not be modeled by SAF, based on statistical analysis of production failures and field failures. A new approach for curve fitting to a classical model is presented. The effect of a pass/fail limit on test quality is discussed
Keywords :
CMOS integrated circuits; automatic testing; curve fitting; fault diagnosis; integrated circuit reliability; integrated circuit testing; production testing; statistical analysis; IDDQ testing; curve fitting; defect level prediction; field failures; pass/fail limit; production failures; statistical analysis; stuck-at-fault model; test quality; Automatic testing; Curve fitting; Design automation; Failure analysis; Fault diagnosis; Helium; Manufacturing; Predictive models; Production; Statistical analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1998. Proceedings., International
Conference_Location :
Washington, DC
ISSN :
1089-3539
Print_ISBN :
0-7803-5093-6
Type :
conf
DOI :
10.1109/TEST.1998.743281
Filename :
743281
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2526997
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