• DocumentCode
    2527086
  • Title

    A non-enumerative path delay fault simulator for sequential circuits

  • Author

    Parodi, Carlos G. ; Agrawal, Vishwani D. ; Bushnell, Michael L. ; Wu, Shianling

  • Author_Institution
    Rutgers Univ., Piscataway, NJ, USA
  • fYear
    1998
  • fDate
    18-23 Oct 1998
  • Firstpage
    934
  • Lastpage
    943
  • Abstract
    We extend the path status graph (PSG) method of delay fault simulation to sequential circuits. By devising a layered PSG and restricting the number of time-frames over which a fault must be detected, we preserve the non-enumerative nature of the simulation algorithm. The program is capable of simulating a wide variety of circuits (synchronous, asynchronous, multiple-clock and tri-state logic.) Both rated and variable clock modes, as well as robust, non-robust or functional sensitization detection options, are available. The simulation can be stopped and restarted through a check pointing facility. The program can target any given list of paths. This path list can also be generated by the program based on user-selectable criteria (all paths, longest paths, paths between certain I/O pairs, etc.) User reports include a histogram of path coverage versus path length. Detected and undetected path data remain implicit in the PSG and can be retrieved through post-processing commands. Due to its non-enumerative stature, the program can process most production level digital logic circuits
  • Keywords
    VLSI; circuit simulation; delays; fault simulation; graph theory; logic gates; logic testing; sequential circuits; check pointing facility; functional sensitization detection; layered PSG; nonenumerative path delay fault simulator; nonrobust detection; path coverage; path length; path status graph; post-processing commands; robust detection; sequential circuits; simulation algorithm; user-selectable criteria; variable clock modes; Circuit faults; Circuit simulation; Clocks; Delay; Electrical fault detection; Fault detection; Histograms; Logic circuits; Robustness; Sequential circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1998. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-5093-6
  • Type

    conf

  • DOI
    10.1109/TEST.1998.743287
  • Filename
    743287