• DocumentCode
    2527100
  • Title

    [Front matter]

  • fYear
    2012
  • fDate
    16-18 May 2012
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    The following topics are dealt with: integrated system design; integrated system technology; and integrated system testing.
  • Keywords
    integrated circuit design; integrated circuit technology; integrated circuit testing; integrated system design; integrated system technology; integrated system testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2012 7th International Conference on
  • Conference_Location
    Gammarth
  • Print_ISBN
    978-1-4673-1926-3
  • Type

    conf

  • DOI
    10.1109/DTIS.2012.6232942
  • Filename
    6232942
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2527100