• DocumentCode
    2527171
  • Title

    Standard test interface language (STIL), extending the standard

  • Author

    Taylor, Tony

  • Author_Institution
    Test Syst. Strategies Inc., Beaverton, OR, USA
  • fYear
    1998
  • fDate
    18-23 Oct 1998
  • Firstpage
    962
  • Lastpage
    970
  • Abstract
    This paper is a status report on the current state of STIL (standard tester interface language) as developed by the IEEE-P1450 standards development committee, followed by a comprehensive overview of the areas that the committee is pursuing for the next round of development for the language. This paper explains the rationale for the extensions being worked on, the applications for these extensions, the process, and the time frame that is expected for this development
  • Keywords
    IEEE standards; automatic test pattern generation; high level languages; integrated circuit testing; ATPG; IC testing; IEEE-P1450 standards development committee; STIL; language extensions; standard test interface language; time frame; Circuit testing; HTML; Integrated circuit testing; Production; Standardization; Standards development; System testing; Transportation; Uniform resource locators; Voting;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1998. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-5093-6
  • Type

    conf

  • DOI
    10.1109/TEST.1998.743291
  • Filename
    743291
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2527171