Influence of conductor loss and thickness in coplanar circuit elements

Author

Vietzorreck, L. ; Pascher, W.

Author_Institution

Allgemeine und Theor. Elektrotech., Fern Univ., Hagen, Germany

Volume

3

fYear

1997

fDate

8-13 June 1997

Firstpage

1811

Abstract

The small dimensions of CPWs require due consideration of finite conductivity and metallization thickness. For this purpose an efficient Method of Lines approach for full-wave analysis of microstrip discontinuities is considerably extended. Two alternative loss models are employed depending on the skin depth. Several cascaded coplanar discontinuities including a quarterwave transformer and a double step are characterized.

Keywords

MMIC; S-parameters; coplanar waveguides; impedance convertors; integrated circuit metallisation; losses; microstrip discontinuities; skin effect; CPWs; MMIC applications; cascaded coplanar discontinuities; conductor loss; coplanar circuit elements; double step; finite conductivity; full-wave analysis; loss models; metallization thickness; method of lines approach; microstrip discontinuities; quarterwave transformer; scattering parameters; skin depth; Circuits; Conductivity; Conductors; Coplanar waveguides; Metallization; Microstrip; Skin; Strips; Surface treatment; Transmission line discontinuities;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 1997., IEEE MTT-S International

Conference_Location

Denver, CO, USA

ISSN

0149-645X

Print_ISBN

0-7803-3814-6

Type

conf

DOI

10.1109/MWSYM.1997.596906

Filename

596906