DocumentCode
2527714
Title
Spice up your life: simulate mixed-signal ICs!
Author
Baker, Keith
Author_Institution
Philips ED&T/Test, Eindhoven, Netherlands
fYear
1998
fDate
18-23 Oct 1998
Firstpage
1131
Abstract
For new mixed-signal products Philips has started to adopt a strategy of testing similar to that used for digital ICs. This is based on efficiently proving the product is free of known defects or other process deformations. This is referred to as DOT or Defect Oriented Testing. It is an alternative to testing the device in production purely to its specification, this has more recently been called SPOT, SPecification Oriented Testing. SPOT is used within Philips but preferable only for device verification and validation as part of design or early in the Test and Product Engineering cycle
Keywords
fault simulation; integrated circuit testing; mixed analogue-digital integrated circuits; production testing; analogue fault simulation; defect oriented testing; device verification; high fault coverage; mixed-signal IC; specification oriented testing; test strategy; validation; Automotive engineering; Circuit faults; Degradation; Digital integrated circuits; Electric resistance; Integrated circuit testing; SPICE; Semiconductor device testing; US Department of Transportation; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1998. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-5093-6
Type
conf
DOI
10.1109/TEST.1998.743321
Filename
743321
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