Title :
Spice up your life: simulate mixed-signal ICs!
Author_Institution :
Philips ED&T/Test, Eindhoven, Netherlands
Abstract :
For new mixed-signal products Philips has started to adopt a strategy of testing similar to that used for digital ICs. This is based on efficiently proving the product is free of known defects or other process deformations. This is referred to as DOT or Defect Oriented Testing. It is an alternative to testing the device in production purely to its specification, this has more recently been called SPOT, SPecification Oriented Testing. SPOT is used within Philips but preferable only for device verification and validation as part of design or early in the Test and Product Engineering cycle
Keywords :
fault simulation; integrated circuit testing; mixed analogue-digital integrated circuits; production testing; analogue fault simulation; defect oriented testing; device verification; high fault coverage; mixed-signal IC; specification oriented testing; test strategy; validation; Automotive engineering; Circuit faults; Degradation; Digital integrated circuits; Electric resistance; Integrated circuit testing; SPICE; Semiconductor device testing; US Department of Transportation; Very large scale integration;
Conference_Titel :
Test Conference, 1998. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5093-6
DOI :
10.1109/TEST.1998.743321
