• DocumentCode
    2527733
  • Title

    Testing mixed signal SOCs

  • Author

    Burns, Mark

  • Author_Institution
    Texas Instrum. Inc., Dallas, TX, USA
  • fYear
    1998
  • fDate
    18-23 Oct 1998
  • Firstpage
    1132
  • Abstract
    There are dozens of issues that will make the testing of mixed signal systems-on-a-chip (SOCs) difficult and costly. Many of these issues are the same ones that have been with the testing community for years. But there are a few testing issues that are either unique to mixed signal SOCs or at least are extremely exaggerated in these highly integrated designs. The problems fall into three basic categories: test development time, analog and mixed-signal performance, and production cost. These problems are briefly discussed
  • Keywords
    fault simulation; integrated circuit testing; mixed analogue-digital integrated circuits; production testing; analog performance; highly integrated designs; mixed signal systems-on-a-chip; mixed-signal performance; production cost; test development challenges; test development time; test simulation; testing problems; Circuit simulation; Circuit testing; Costs; Instruments; Logic testing; Merging; Production; Signal design; System testing; System-on-a-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1998. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-5093-6
  • Type

    conf

  • DOI
    10.1109/TEST.1998.743322
  • Filename
    743322