Title :
VIDS: visual interpretation for device simulations
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Abstract :
Visualization is an increasingly important aspect of device design to interpret simulation and empirical data; effective visualization tools can accelerate the design process. VIDS is a set of interactive tools for 2D and 3D device models, 2D process models, lithography data, 2D and 3D interconnect analysis, and empirical STM scans. VIDS features and several examples are presented.<>
Keywords :
circuit CAD; circuit analysis computing; data visualisation; digital simulation; integrated circuit design; integrated circuit interconnections; integrated circuit modelling; lithography; scanning tunnelling microscopy; 2D device models; 2D process models; 3D device models; IC design analysis; VIDS; data visualization; design process; device simulations; digital simulation; empirical STM scans; interactive tools; interconnect analysis; lithography data; visual interpretation; Art; Data visualization; Isosurfaces; Lithography; Process design; Scanning probe microscopy; Stress; Tiles; Two dimensional displays; User interfaces;
Conference_Titel :
Electron Devices Meeting, 1994. IEDM '94. Technical Digest., International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-2111-1
DOI :
10.1109/IEDM.1994.383425
