DocumentCode
2527752
Title
When two worlds merge [test issues for system-level ICs]
Author
Lanier, Ken
Author_Institution
LTX. Corp., USA
fYear
1998
fDate
18-23 Oct 1998
Firstpage
1133
Abstract
The rapid integration of large-scale mixed-signal and digital IC designs has created entirely new demands on test engineers and test equipment manufacturers. There are three areas of most concern when considering the changes that must take place in the test community to accommodate this technology shift. These are: test techniques, test equipment capabilities and time to market. Each of these are briefly discussed
Keywords
automatic test equipment; integrated circuit testing; mixed analogue-digital integrated circuits; production testing; standardisation; digital IC; large-scale mixed-signal IC; rapid integration; standardization; system-on-a-chip IC; technology shift; test equipment capabilities; test techniques; time to market; universal test platform;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1998. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-5093-6
Type
conf
DOI
10.1109/TEST.1998.743323
Filename
743323
Link To Document