Title :
Test vector embedding in accumulators with stored carry in O(1) time
Author :
Voyiatzis, I. ; Efstathiou, C. ; Sgouropoulou, C.
Author_Institution :
Dept. of Inf., Technol. Educ. Inst. of Athens, Athens, Greece
Abstract :
In test set embedding Built-In Self Test (BIST) schemes a precomputed test set is embedded into the sequence generated by a hardware generator. These schemes have to evaluate the location of each test pattern in the sequence as fast as possible, in order to test as many as possible candidate configurations of the test pattern generator; this problem is known as the test vector-embedding problem. In this paper we present a O(1) solution to the test vector-embedding problem for sequences generated by accumulators.
Keywords :
adders; built-in self test; secondary cells; sequences; test equipment; vectors; accumulator; hardware generator; sequence generation; test pattern generator; test pattern location evaluation; test set embedding BIST scheme; test set embedding built-in self test scheme; test set precomputation; Adders; Built-in self-test; Hardware; Nanoscale devices; Vectors; Very large scale integration;
Conference_Titel :
Design & Technology of Integrated Systems in Nanoscale Era (DTIS), 2012 7th International Conference on
Conference_Location :
Gammarth
Print_ISBN :
978-1-4673-1926-3
DOI :
10.1109/DTIS.2012.6232976
