Test vector embedding in accumulators with stored carry in O(1) time

In test set embedding Built-In Self Test (BIST) schemes a precomputed test set is embedded into the sequence generated by a hardware generator. These schemes have to evaluate the location of each test pattern in the sequence as fast as possible, in order to test as many as possible candidate configurations of the test pattern generator; this problem is known as the test vector-embedding problem. In this paper we present a O(1) solution to the test vector-embedding problem for sequences generated by accumulators.