Next generation Stanford TCAD-PISCES 2ET and SUPREM 007

Author

Beebe, S. ; Rotella, F. ; Sahul, Z. ; Yergeau, D. ; McKenna, G. ; So, L. ; Yu, Z. ; Wu, K.C. ; Kan, E. ; McVittie, J. ; Dutton, R.W.

Author_Institution

Center for Integrated Syst., Stanford Univ., CA, USA

fYear

1994

fDate

11-14 Dec. 1994

Firstpage

213

Lastpage

216

Abstract

Different aspects of Process and Device Simulators developed at Stanford are demonstrated. For PISCES 2ET, a new transport model is benchmarked in comparison to other simplified formulations. Support utilities related to curve tracing are demonstrated. The modular integration of standard tools such SUPREM 4GS and SPEEDIE with a heterogeneous set of other simulators using an agent-based approach (007) is demonstrated.<>

Keywords

circuit CAD; circuit analysis computing; curve fitting; digital simulation; integrated circuit modelling; object-oriented methods; IC modelling; PISCES 2ET; SPEEDIE; SUPREM 007; SUPREM 4GS; agent-based approach; curve tracing; device simulators; modular integration; next generation Stanford TCAD; process simulators; transport model; Breakdown voltage; Electrostatic discharge; Integrated circuit modeling; Kinetic theory; Lattices; MOS devices; MOSFET circuits; Robustness; Usability; Visualization;

fLanguage

English

Publisher

ieee

Conference_Titel

Electron Devices Meeting, 1994. IEDM '94. Technical Digest., International

Conference_Location

San Francisco, CA, USA

ISSN

0163-1918

Print_ISBN

0-7803-2111-1

Type

conf

DOI

10.1109/IEDM.1994.383428

Filename

383428