مرکز منطقه ای اطلاع رساني علوم و فناوري - Scaling deeper to submicron: on-line testing to the rescue

DocumentCode :

2527864

Title :

Scaling deeper to submicron: on-line testing to the rescue

Author :

Nicolaidis, M.

Author_Institution :

TIMA

fYear :

1998

fDate :

18-23 Oct. 1998

Firstpage :

1139

Lastpage :

1139

Keywords :

CMOS process; Circuit testing; Costs; Earth; Energy states; Frequency; Low voltage; Neutrons; Noise reduction; Single event transient;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Test Conference, 1998. Proceedings., International

Conference_Location :

Washington, DC, USA

ISSN :

1089-3539

Print_ISBN :

0-7803-5093-6

Type :

conf

DOI :

10.1109/TEST.1998.743330

Filename :

743330

Link To Document :