• DocumentCode
    2527899
  • Title

    High-precision robot system for inspection and testing of electronic devices

  • Author

    Beni, G. ; Hackwood, S. ; Trimmer, W.S.

  • Author_Institution
    Bell Laboratories, Holmdel, NJ
  • Volume
    1
  • fYear
    1984
  • fDate
    30742
  • Firstpage
    428
  • Lastpage
    441
  • Abstract
    We describe a feasibility demonstration of an ´intelligent´ robot system for inspection and testing of electronic properties of devices. The system consists of a Seiko RT-3000 robot, an Automatix Autovision II vision system, two CCD Panasonic cameras plus peripherals. The latter include two testing probe-stations, a passive-hand with magnetic pick-up fingertips, racks and pallets. The system is interconnected through serial RS-232 ports and I/O switches. The system is capable of relocating devices with a precision of 0.1 mm. The initial part-presentation requires only a ≈ 10 cm precision. The system is presently set up to demonstrate the measurement of capacitance and dark- current of InGaAs PIN photodetectors.
  • Keywords
    Charge coupled devices; Charge-coupled image sensors; Electronic equipment testing; Inspection; Intelligent robots; Intelligent systems; Machine vision; Robot vision systems; Robotics and automation; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Robotics and Automation. Proceedings. 1984 IEEE International Conference on
  • Type

    conf

  • DOI
    10.1109/ROBOT.1984.1087192
  • Filename
    1087192