• DocumentCode
    2527903
  • Title

    3.5 V, 1 W high efficiency AlGaAs/GaAs HBTs with collector launcher structure

  • Author

    Tateno, Y. ; Yamada, H. ; Ohara, S. ; Kato, S. ; Ohnishi, H. ; Fujii, T. ; Fukaya, J.

  • Author_Institution
    Fujitsu Labs. Ltd., Kawasaki, Japan
  • fYear
    1994
  • fDate
    11-14 Dec. 1994
  • Firstpage
    195
  • Lastpage
    198
  • Abstract
    AlGaAs/GaAs HBTs with collector launcher structure are developed for the low operation voltage power amplifier. We discuss the relationship between the HBT collector structure and its microwave power performance, demonstrating that the launcher structure suppresses the Kirk effect near the saturation region and increases the current handling capability. A fabricated HBT, which has an emitter size of 2 /spl mu/m/spl times/20 /spl mu/m/spl times/32 fingers, exhibits a power added efficiency, /spl eta/add, of 70% with an output power, Pout, of 30 dBm and a power gain, Ga, of 15.7 dB at a supply voltage of 3.5 V and a frequency of 900 MHz. At 2.5 V, Pout is 26.5 dBm, /spl eta/add is 70% and Ga is 14.7 dB. These results demonstrate that HBTs with a collector launcher structure are appropriate for power applications, especially at low voltage operation.<>
  • Keywords
    III-V semiconductors; UHF bipolar transistors; aluminium compounds; gallium arsenide; heterojunction bipolar transistors; microwave bipolar transistors; microwave power transistors; power bipolar transistors; 1 W; 14.7 to 15.7 dB; 2.5 to 3.5 V; 900 MHz; AlGaAs-GaAs; Kirk effect suppression; LV power amplifier application; UHF power performance; collector launcher structure; current handling capability; low operation voltage; microwave power performance; Electrodes; Fingers; Gallium arsenide; Heterojunction bipolar transistors; High power amplifiers; Kirk field collapse effect; Low voltage; Mobile communication; Power amplifiers; Power generation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 1994. IEDM '94. Technical Digest., International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0163-1918
  • Print_ISBN
    0-7803-2111-1
  • Type

    conf

  • DOI
    10.1109/IEDM.1994.383432
  • Filename
    383432