Title :
Amorphous silicon edge detector for application to electronic eyes
Author :
Wen-Jyh Sah ; Si-Chen Lee ; Jyh-Hong Chen
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Abstract :
Two types of novel a-Si:H edge detectors, i.e. concentric and directional ones, are successfully fabricated. The measured performance of the edge detector is similar to that of the resistor network Si retina using analog VLSI technology. Two- and three-dimensional architectures of the a-Si:H image detection array combined with the Si VLSI technology are also discussed with application to the preprocessor for a smart vision system.<>
Keywords :
VLSI; amorphous semiconductors; computer vision; elemental semiconductors; hydrogen; image sensors; silicon; Si retina; VLSI technology; amorphous Si:H edge detectors; concentric edge detectors; directional edge detectors; electronic eyes; image detection array; preprocessor; smart vision system; three-dimensional architectures; two-dimensional architectures; Amorphous silicon; Detectors; Eyes; Image edge detection; Machine vision; Photoconductivity; Pixel; Resistors; Retina; Very large scale integration;
Conference_Titel :
Electron Devices Meeting, 1989. IEDM '89. Technical Digest., International
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-0817-4
DOI :
10.1109/IEDM.1989.74334
