• DocumentCode
    252804
  • Title

    Silicon substrate strength enhancement depending on nanostructure morphology

  • Author

    Kashyap, Kunal ; Kumar, Ajit ; Chung-Yao Yang ; Hou, Max T. ; Yeh, J. Andrew

  • Author_Institution
    Inst. of Nanoengineering & Microsyst., Nat. Tsing Hua Univ., Hsinchu, Taiwan
  • fYear
    2014
  • fDate
    13-16 April 2014
  • Firstpage
    390
  • Lastpage
    393
  • Abstract
    Silicon nanostructures are extensively being researched for many different applications for industries. Here we present two different types of nanostructures, silicon nanoplates and nanoholes fabricated by electroless metal assisted wet etching for enhancing the bending strength by ~3.7 fold and ~6 fold respectively as compared to polished silicon samples which emphasize the dependence of bending strength on nanostructure morphologies. Roughness at the nanostructure bottom cause stress concentration to increase which degrades the bending strength. Moreover, this technology can open a pathway of flexible silicon substrates for flexible and bendable electronics.
  • Keywords
    bending; elemental semiconductors; etching; mechanical strength; nanofabrication; nanostructured materials; silicon; substrates; surface morphology; surface roughness; Si; bendable electronics; bending strength; electroless metal assisted wet etching; flexible electronics; nanoholes; nanostructure bottom roughness; nanostructure morphologies; nanostructure morphology; silicon nanoplates; silicon substrate strength enhancement; stress concentration; Etching; Fabrication; Industries; Silicon; Stress; Surface morphology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nano/Micro Engineered and Molecular Systems (NEMS), 2014 9th IEEE International Conference on
  • Conference_Location
    Waikiki Beach, HI
  • Type

    conf

  • DOI
    10.1109/NEMS.2014.6908834
  • Filename
    6908834