Title :
Silicon substrate strength enhancement depending on nanostructure morphology
Author :
Kashyap, Kunal ; Kumar, Ajit ; Chung-Yao Yang ; Hou, Max T. ; Yeh, J. Andrew
Author_Institution :
Inst. of Nanoengineering & Microsyst., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Abstract :
Silicon nanostructures are extensively being researched for many different applications for industries. Here we present two different types of nanostructures, silicon nanoplates and nanoholes fabricated by electroless metal assisted wet etching for enhancing the bending strength by ~3.7 fold and ~6 fold respectively as compared to polished silicon samples which emphasize the dependence of bending strength on nanostructure morphologies. Roughness at the nanostructure bottom cause stress concentration to increase which degrades the bending strength. Moreover, this technology can open a pathway of flexible silicon substrates for flexible and bendable electronics.
Keywords :
bending; elemental semiconductors; etching; mechanical strength; nanofabrication; nanostructured materials; silicon; substrates; surface morphology; surface roughness; Si; bendable electronics; bending strength; electroless metal assisted wet etching; flexible electronics; nanoholes; nanostructure bottom roughness; nanostructure morphologies; nanostructure morphology; silicon nanoplates; silicon substrate strength enhancement; stress concentration; Etching; Fabrication; Industries; Silicon; Stress; Surface morphology;
Conference_Titel :
Nano/Micro Engineered and Molecular Systems (NEMS), 2014 9th IEEE International Conference on
Conference_Location :
Waikiki Beach, HI
DOI :
10.1109/NEMS.2014.6908834