Title :
How real is the new SIA roadmap for mixed-signal test equipment?
Author :
Ortner, William R.
Author_Institution :
Lucent Technol., Bell Labs., Allentown, PA, USA
Abstract :
The 1997 SIA roadmap for test equipment is summarized in two tables-Microprocessor and ASIC Test Equipment Requirements, for digital test, and Mixed Signal Test Equipment Requirements, for analog instrument requirements. The digital test equipment needs for mixed signal devices is expected to be the same as for purely digital devices. The clear trend for digital is toward higher pin count and higher speed and we fully expect to see complex analog functions on the same silicon with all this digital-the so called Systems-On-A-Chip. As a principal contributor and the coordinator for the SIA mixed signal test requirements, I would like to comment on how real the mixed signal roadmap appears one year later
Keywords :
automatic test equipment; electronics industry; integrated circuit testing; mixed analogue-digital integrated circuits; 1997 SIA Roadmap; ATE requirements; analog instrument requirements; cost of test; mixed-signal test equipment; systems-on-a-chip; Application specific integrated circuits; Circuit testing; Costs; Instruments; Jitter; Microprocessors; Silicon; System testing; Test equipment; Throughput;
Conference_Titel :
Test Conference, 1998. Proceedings., International
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5093-6
DOI :
10.1109/TEST.1998.743352
