DocumentCode :
252830
Title :
Mechanical modeling and characterization of silicon micro cooler
Author :
Che, F.X. ; Yong Han ; Boon Long Lau ; Hengyun Zhang ; Lu Zhang ; Xiaowu Zhang
Author_Institution :
Inst. of Microelectron., A*STAR (Agency for Sci., Technol. & Res.), Singapore, Singapore
fYear :
2014
fDate :
3-5 Dec. 2014
Firstpage :
822
Lastpage :
827
Abstract :
As chip power densities are now increasing beyond air cooling limits, a variety of liquid cooling methods are being investigated. The silicon microchannel cooling (SMC) is an attractive approach due to its high heat transfer coefficient. In this study, a thermal test chip with heating spots was mounted onto a synthetic diamond heat spreader, and then mounted onto the SMC cooler through temperature compression bonding (TCB) process. Finally, this structure was mounted onto the printed circuit board (PCB) and connected with the manifold. The reliability of the cooler system was investigated through mechanical modeling and characterization. Four types of models were conducted considering process flow and application conditions, including model of bonding thermal chip to heater spreader, model of whole cooler structure assembly, shear test model, and thermal-mechanical coupling analysis model considering hot spot heating. The cooler system was optimized based on finite element modeling results to reduce chip stress and package warpage. Die attach materials were also evaluated based on shear test and modeling results. The thermo-mechanical coupling simulation was conducted for cooler system by considering temperature non-uniform distribution due to hot spot and cooling effect. Results show that the designed cooler system meets the requirement of performance and reliability thermally and mechanically.
Keywords :
cooling; elemental semiconductors; finite element analysis; microassembling; micromechanical devices; printed circuits; reliability; silicon; temperature distribution; thermal management (packaging); thermomechanical treatment; Si; chip stress; cooler structure assembly; die attach materials; finite element modeling; heater spreader; hot spot heating; mechanical modeling; mechanical reliability; package warpage; printed circuit board; shear test model; silicon microchannel cooling; silicon microcooler; temperature compression bonding process; temperature nonuniform distribution; thermal chip bonding; thermal reliability; thermal-mechanical coupling analysis model; Analytical models; Bonding; Diamonds; Heating; Materials; Microassembly; Stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference (EPTC), 2014 IEEE 16th
Conference_Location :
Singapore
Type :
conf
DOI :
10.1109/EPTC.2014.7028364
Filename :
7028364
Link To Document :
بازگشت