Title :
Characterization of a silicone gel as a coating use for corrosion protection
Author :
Ishida, Hisashi ; Nakata, Kensuke ; Otsuka, Kanji
Author_Institution :
Hitachi Ltd., Tokyo, Japan
Abstract :
The authors report on failure mechanisms and microstructure characterization of silicon gel as a protective coating on integrated circuits. The corrosive effects of water in permeating the sealing layer, penetrating, and forming voids in the gel were observed. The relation of protection reliability to gel cure temperature was analyzed using infrared absorption spectra, a mass spectrum analyzer, and scanning electron microscopy. It is concluded that penetrating water removes gel through vaporization due to a temperature gradient, and that insufficiently cured gel contains relatively large holes that allow water penetration rather than only trapping gas molecules as small holes in the properly cured gel.<>
Keywords :
corrosion protective coatings; corrosion testing; failure analysis; gels; integrated circuit technology; scanning electron microscope examination of materials; silicones; spectrochemical analysis; corrosion protection; failure mechanisms; gel cure temperature; integrated circuits; mass spectrum analyzer; microstructure characterization; protection reliability; protective coating; scanning electron microscopy; silicon gel; temperature gradient; vaporization; voids; water penetration; Coatings; Corrosion; Electromagnetic wave absorption; Failure analysis; Infrared spectra; Integrated circuit reliability; Microstructure; Protection; Silicon; Temperature;
Conference_Titel :
Electronics Components Conference, 1988., Proceedings of the 38th
Conference_Location :
Los Angeles, CA, USA
DOI :
10.1109/ECC.1988.12631