• DocumentCode
    2528708
  • Title

    High bandwidth electron tunneling trasnducer using frequency downmixing readout of nanomechanical motion

  • Author

    Kan, M.R. ; Finley, E. ; Fortin, D.C. ; Freeman, M.R. ; Hiebert, W.K.

  • Author_Institution
    Nat. Inst. for Nanotechnol., NRC Canada, Edmonton, AB, Canada
  • fYear
    2011
  • fDate
    5-9 June 2011
  • Firstpage
    60
  • Lastpage
    63
  • Abstract
    Electron tunneling transduction based on quantum tunneling is very sensitive to the change of the distance from the probing tip apex to the sample surface and can be used as displacement transducer to detect the miniscule displacement of NEMS devices. However a limitation in electron tunneling transduction is the low detection bandwidth due to readout circuit frequency rolloff at a few 10´s kHz. Here a novel electron tunneling transduction utilizing frequency downmixing directly in the tunneling junction overcomes the limitation of the detection bandwidth [1]. With this technique the high frequency vibration modes of doubly-clamped beams are measured, well above the RC rolloff of the STM measuring circuits.
  • Keywords
    beams (structures); clamps; nanoelectromechanical devices; readout electronics; scanning tunnelling microscopy; transducers; tunnelling; NEMS device; STM measuring circuit; displacement transducer; doubly-clamped beam; frequency 10 kHz; frequency downmixing readout; frequency vibration; high bandwidth electron tunneling transducer; miniscule displacement detection; nanomechanical motion; probing tip apex; quantum tunneling; readout circuit frequency rolloff; tunneling junction; Frequency measurement; Micromechanical devices; Nanoelectromechanical systems; Noise; Resonant frequency; Transducers; Tunneling; Electron tunneling transduction; MEMS and NEMS; frequency downmixing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS), 2011 16th International
  • Conference_Location
    Beijing
  • ISSN
    Pending
  • Print_ISBN
    978-1-4577-0157-3
  • Type

    conf

  • DOI
    10.1109/TRANSDUCERS.2011.5969134
  • Filename
    5969134