Title :
Multi-voltage aware resistive open fault modeling
Author :
Mohammadat, Mohamed Tagelsir ; Ali, Noohul Basheer Zain ; Hussin, Fawnizu Azmadi
Author_Institution :
Electr. & Electron. Eng., Univ. Teknol. PETRONAS, Tronoh, Malaysia
Abstract :
Resistive open fault (ROF) represents common manufacturing defects causing extra delays and reliability risks in affected circuits. ROF behavior is sensitive to the supply voltage and the resistance of open (RO). Modeling this fault behavior and detectability with the supply voltage helps in distinguishing between faults as well as testing of multi-voltage designs. While previous ROF models did not explicitly consider these dependencies. Therefore in this paper, these dependencies were investigated by exhaustive parametric SPICE simulation considering different technology models. A voltage aware model is proposed by dividing the full RO continuum into resistance intervals and ranges.
Keywords :
circuit reliability; delays; fault diagnosis; network synthesis; power aware computing; ROF; delay; manufacturing defect; multivoltage aware resistive open fault modeling; multivoltage design testing; parametric SPICE simulation; reliability; supply voltage detection; Circuit faults; Clocks; Delay; Integrated circuit modeling; Logic gates; Resistance; Testing; Open Resistance Intervals; Resistive Open Faults (ROF); Small Delay Faults; Voltage Aware Modeling;
Conference_Titel :
Test Symposium (ETS), 2012 17th IEEE European
Conference_Location :
Annecy
Print_ISBN :
978-1-4673-0696-6
Electronic_ISBN :
978-1-4673-0695-9
DOI :
10.1109/ETS.2012.6233021
