Photothermal deflection spectroscopy measurements of an anisotropic superlattice

Author

Foley, Jason R. ; Avedisian, C.Thomas

Author_Institution

Sibley Sch. of Mech. & Aerosp. Eng., Cornell Univ., Ithaca, NY, USA

fYear

2004

fDate

29-31 July 2004

Firstpage

581

Lastpage

582

Abstract

The temperature field created by periodic heating of an anisotropic, N-layer system is considered. Anisotropic thermal conductivity, nonuniform internal heat generation, and interlayer thermal boundary resistance are all included in the model. The analytic expressions are applied to the photothermal deflection spectroscopy (PDS) method for thermal property measurement with emphasis on super-lattice systems. Computational results indicate the feasibility of determining the thermal properties of the superlattice layers, including the interlayer contact resistance. Calculated probe beam deflection are then analyzed to estimate the effective thermal properties of a superlattice. The results demonstrate the efficacy of PDS for nondestructive measurements of a superlattice structure.

Keywords

anisotropic media; contact resistance; heat measurement; heating; nondestructive testing; photothermal spectroscopy; semiconductor superlattices; thermal conductivity measurement; thermal resistance; N-layer system; analytic expression; anisotropic superlattice structure; anisotropic thermal conductivity; interlayer contact resistance; internal heat generation; periodic heating; photothermal deflection spectroscopy; probe beam deflection; thermal boundary resistance; thermal property measurement; Anisotropic magnetoresistance; Contact resistance; Electrical resistance measurement; Heating; Probes; Spectroscopy; Superlattices; Temperature; Thermal conductivity; Thermal resistance;

fLanguage

English

Publisher

ieee

Conference_Titel

Energy Conversion Engineering Conference, 2002. IECEC '02. 2002 37th Intersociety

Print_ISBN

0-7803-7296-4

Type

conf

DOI

10.1109/IECEC.2002.1392110

Filename

1392110