• DocumentCode
    2528882
  • Title

    Diagnostic system based on support-vector machines for board-level functional diagnosis

  • Author

    Zhaobo Zhang ; Xinli Gu ; Yaohui Xie ; Zhiyuan Wang ; Zhanglei Wang ; Chakrabarty, Krishnendu

  • Author_Institution
    Huawei Technol., Co. Ltd., Santa Clara, CA, USA
  • fYear
    2012
  • fDate
    28-31 May 2012
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Fault diagnosis is critical for improving product yield and reducing manufacturing cost. However, it is very challenging to identify the root cause of failures on a complex circuit board. Ambiguous diagnosis results lead to long debug times and even wrong repair actions, which significantly increases the repair cost. We propose an automatic diagnostic system using support vector machines (SVMs). The proposed system acquires debug knowledge from empirical data; this strategy avoids the difficulties involved in knowledge acquisition in traditional fault diagnosis methods. SVMs provide an optimal separating hyperplane in classification. The optimal solution and generalization ability of SVMs lead to higher diagnostic accuracy, compared to the classical learning approaches such as artificial neural networks (ANNs). An industrial board is used to validate the effectiveness of the proposed system. Extensive simulation results demonstrate that the SVMs-based diagnostic system provides quantifiable improvement over current diagnostic software and an ANN-based diagnostic system.
  • Keywords
    cost reduction; electronic engineering computing; fault diagnosis; knowledge acquisition; printed circuit manufacture; support vector machines; ANN; SVM; artificial neural network; classical learning approach; complex printed circuit board; fault diagnosis system; knowledge acquisition; manufacturing cost reduction; optimal separating hyperplane; product yield improvement; repair cost; support-vector machine; Fault diagnosis; Kernel; Maintenance engineering; Strontium; Support vector machines; Training; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ETS), 2012 17th IEEE European
  • Conference_Location
    Annecy
  • Print_ISBN
    978-1-4673-0696-6
  • Electronic_ISBN
    978-1-4673-0695-9
  • Type

    conf

  • DOI
    10.1109/ETS.2012.6233029
  • Filename
    6233029