DocumentCode :
2529023
Title :
Proceedings of 1994 IEEE International Electron Devices Meeting
fYear :
1994
fDate :
11-14 Dec. 1994
Abstract :
Presents the front cover from the conference proceedings.
Keywords :
CMOS integrated circuits; dielectric thin films; digital integrated circuits; display devices; integrated circuit reliability; integrated circuit technology; micromachining; optoelectronic devices; power electronics; semiconductor device models; semiconductor devices; semiconductor lasers; semiconductor process modelling; semiconductor storage; semiconductor technology; sensors; vacuum microelectronics; CMOS device optimization; MOSFET modelling; SiGe devices; electronic transport modelling; fast wave devices; ferroelectric cathodes; flash EPROM; flash memory technology; gate dielectrics; heterojunction bipolar transistors; hot carrier reliability; magnetic sensors; micromachined sensors; microprocessor technology; multilevel interconnect technology; power IC; process modelling; programmable logic technologies; subm; vacuum microelectronics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1994. IEDM '94. Technical Digest., International
Conference_Location :
San Francisco, CA, USA
ISSN :
0163-1918
Print_ISBN :
0-7803-2111-1
Type :
conf
DOI :
10.1109/IEDM.1994.383476
Filename :
383476
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2529023
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