DocumentCode :
2529025
Title :
A high-sensitive ultra-thin MEMS capacitive pressure sensor
Author :
Zhang, Y. ; Howver, R. ; Gogoi, B. ; Yazdi, N.
Author_Institution :
Evigia Syst., Inc., Ann Arbor, MI, USA
fYear :
2011
fDate :
5-9 June 2011
Firstpage :
112
Lastpage :
115
Abstract :
This paper reports an ultra-thin MEMS capacitive pressure sensor with high pressure sensitivity of better than 150aF/Pa, and small die size of 1.0mm × 1.0mm × 60μm. It is able to detect ambient pressure change with a resolution of 0.025% in a pressure range +/-3.5KPa. This capacitive pressure sensor decouples the pressure sensing from its capacitance sensing by using a hermetically sealed capacitor that is electrically isolated but mechanically coupled with a pressure sensing diaphragm such that a large dynamic range and high pressure sensitivity can be readily achieved. Because the capacitor is hermetically sealed in a cavity, this capacitive pressure sensor is also immune to measurement media and EMI (Electromagnetic Interference) effects.
Keywords :
capacitive sensors; capacitors; diaphragms; electromagnetic interference; microsensors; pressure sensors; EMI effect; ambient pressure change detection; electromagnetic interference effect; hermetically sealed capacitor; high-sensitive ultra-thin MEMS capacitive pressure sensor; measurement media; pressure sensing diaphragm; Capacitance; Capacitors; Cavity resonators; Dynamic range; Pressure measurement; Sensitivity; Sensors; Capacitive pressure sensor; EMI resistance; MEMS; Ultra-thin; high sensitivity; immune to media; large dynamic range;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS), 2011 16th International
Conference_Location :
Beijing
ISSN :
Pending
Print_ISBN :
978-1-4577-0157-3
Type :
conf
DOI :
10.1109/TRANSDUCERS.2011.5969151
Filename :
5969151
Link To Document :
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