DocumentCode :
2529325
Title :
Self-cleaning mass calibration of a thermogravimetric device using a thin-film molybdenum
Author :
Iervolino, E. ; Mele, L. ; Santagata, F. ; van Herwaarden, A.W. ; van der Vlist, W. ; Creemer, J.F. ; Sarro, P.M.
Author_Institution :
Xensor Integration, Delfgauw, Netherlands
fYear :
2011
fDate :
5-9 June 2011
Firstpage :
1038
Lastpage :
1041
Abstract :
This paper presents a self-cleaning mass calibration procedure for a thermogravimetric (TC) device using molybdenum (Mo). A Mo thin-film is deposited by sputtering and patterned with known geometry on the device sample area using a standard lithography step thus giving accurate control of the mass of the sample under investigation. The device resonance frequency is measured while the temperature of the sample area is increased from room temperature to about 923 K using the integrated heater. First the Mo oxidizes. Then, at temperatures above 773 K the Mo trioxide (MoO3) evaporates. This causes a shift in resonance frequency that can be linked to the known initial mass of the Mo. An advantage of this method is that, the Mo leaves the device clean and ready for TG analysis (TGA) of other samples.
Keywords :
calibration; micromechanical devices; molybdenum; sputtering; thermal analysis; thin film devices; TG analysis; integrated heater; resonance frequency; self-cleaning mass calibration; sputtering; standard lithography; temperature 923 K; thermogravimetric device; thin-film molybdenum; Calibration; Frequency measurement; Heating; Plasma temperature; Resonant frequency; Temperature measurement; Temperature sensors; Cantilever; mass calibration; thermogravimetry;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems Conference (TRANSDUCERS), 2011 16th International
Conference_Location :
Beijing
ISSN :
Pending
Print_ISBN :
978-1-4577-0157-3
Type :
conf
DOI :
10.1109/TRANSDUCERS.2011.5969167
Filename :
5969167
Link To Document :
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