• DocumentCode
    2529361
  • Title

    Development of an active-matrix "HEED" cold cathode and its application to an image sensor

  • Author

    Tanaka, Ryota ; Matsuba, Yohei ; Nakada, Tomonari ; Sakemura, Kazuto ; Negishi, Nobuyasu ; Okuda, Yoshiyuki ; Sato, Hideo ; Watanabe, Atsushi ; Yoshikawa, Takamasa ; Ogasawara, Kiyohide ; Nanba, Masakazu ; Okazaki, Saburo ; Tanioka, Kenkichi ; Egami, Nori

  • Author_Institution
    Corporate R&D Labs., Pioneer Corp., Saitama
  • Volume
    2
  • fYear
    2006
  • fDate
    25-29 Sept. 2006
  • Firstpage
    845
  • Lastpage
    848
  • Abstract
    For practical advantages of the HEED (high-efficiency electron emission device) such as a low driving voltage, a high emission current density, especially application to an ultra high sensitive compact image sensor can be expected. A prototype active-matrix HEED image sensor integrated with scanning driver circuits was developed with a HARP (high-gain avalanche rushing amorphous photoconductor) target. It was demonstrated that the prototype 256 times 192 pixels active-matrix HEED array operates well as an effective probe for high-resolution image pickup under dim lighting. The possibility of the active-matrix HEED for development of next-generation image sensor with ultra high sensitivity and high definition was concluded in this report
  • Keywords
    cathodes; electron emission; high energy electron diffraction; image sensors; photoconducting materials; HARP; HEED; active matrix; cold cathode; high efficiency electron emission device; high emission current density; high-gain avalanche rushing amorphous photoconductor; image sensor; low driving voltage; scanning driver circuits; Active matrix technology; Amorphous materials; Cathodes; Current density; Driver circuits; Electron emission; Image sensors; Low voltage; Photoconducting devices; Prototypes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Discharges and Electrical Insulation in Vacuum, 2006. ISDEIV '06. International Symposium on
  • Conference_Location
    Matsue
  • ISSN
    1093-2941
  • Print_ISBN
    1-4244-0191-7
  • Electronic_ISBN
    1093-2941
  • Type

    conf

  • DOI
    10.1109/DEIV.2006.357435
  • Filename
    4195016