DocumentCode
2529595
Title
Performance of coherent MFSK schemes over slow flat fading channels
Author
Chandra, Aniruddha ; Poram, Srinivasa Rao ; Bose, Chayanika
Author_Institution
E.C.E. Dept., N.I.T. Durgapur, Durgapur
fYear
2008
fDate
19-21 Nov. 2008
Firstpage
1
Lastpage
6
Abstract
Analytical solutions for the average symbol error rate of coherent M-ary frequency shift keying (MFSK) modulation schemes operating over frequency non-selective slow fading channels corrupted by additive white Gaussian noise (AWGN) are derived. Starting from the alternate expressions for integer powers (n < 5) of Gaussian Q function, the symbol error probabilities (SEP) are obtained using probability density function (pdf) based approach. The derived end expressions composed of finite range integrals can be numerically computed and gives either exact values or provide tighter lower bounds. Different small scale fading statistics such as Rayleigh, Rician (Nakagami-n), Hoyt (Nakagami-q), and Nakagami-m has been considered for channel modelling. Error probabilities are graphically displayed for each model with different values of modulation order M and also for corresponding fading parameters (K, q, and m). The theoretical results presented offers insight to assess the efficacy of relatively less studied coherent MFSK in context of the optimum modulation choice in wireless communication.
Keywords
AWGN channels; Nakagami channels; Rayleigh channels; Rician channels; fading channels; frequency shift keying; radiocommunication; AWGN; Hoyt; M-ary frequency shift keying modulation; MFSK schemes; Nakagami-m; Nakagami-n; Nakagami-q; Rayleigh; Rician; additive white Gaussian noise; analytical solutions; fading channels; probability density function; symbol error probabilities; symbol error rate; wireless communication; AWGN; Additive white noise; Error analysis; Error probability; Fading; Frequency shift keying; Integral equations; Probability density function; Rayleigh channels; Statistics; Hoyt; MFSK; Nakagami-m; Q function; Rayleigh; Rician;
fLanguage
English
Publisher
ieee
Conference_Titel
TENCON 2008 - 2008 IEEE Region 10 Conference
Conference_Location
Hyderabad
Print_ISBN
978-1-4244-2408-5
Electronic_ISBN
978-1-4244-2409-2
Type
conf
DOI
10.1109/TENCON.2008.4766678
Filename
4766678
Link To Document