• DocumentCode
    2529722
  • Title

    Combined Wavelet Transform and ANN for power system security analysis

  • Author

    Sutha, S. ; Kamaraj, N.

  • Author_Institution
    PSNA Coll. of Eng. & Technol., Dindigul
  • fYear
    2008
  • fDate
    19-21 Nov. 2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Power system security is one of the vital concerns in competitive electricity markets due to delineation of the system controller and the generation owner. This paper presents a new approaches based on artificial neural networks combined with wavelet transform is developed for power system security analysis. The off-line AC load flow calculations are used to construct three kinds of violation indices namely line over load index (LOI), power margin index (PIP) and voltage stability index. Wavelet transform is used to decompose the data into several coefficients which are fed to artificial neural network for estimating the violation indices. The effectiveness of the proposed approach has been demonstrated on 6-bus and IEEE 30- bus systems for contingency screening ranking at different loading conditions and comparisons are made with conventional method. Good calculation accuracy, faster analysis times are obtained by using wavelet transform based neural network.
  • Keywords
    neural nets; power engineering computing; power markets; power system control; power system security; wavelet transforms; 6-bus systems; ANN; IEEE 30- bus systems; LOI; artificial neural network; combined wavelet transform; electricity markets; line over load index; off-line AC load flow calculations; power margin index; power system security analysis; system controller; voltage stability index; Artificial neural networks; Control systems; Electricity supply industry; Load flow; Power generation; Power system security; Power system stability; Voltage; Wavelet analysis; Wavelet transforms; Artificial Neural Network; Contingency Screening; Performance Indices; Static Security Assessment; Wavelet Transform;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    TENCON 2008 - 2008 IEEE Region 10 Conference
  • Conference_Location
    Hyderabad
  • Print_ISBN
    978-1-4244-2408-5
  • Electronic_ISBN
    978-1-4244-2409-2
  • Type

    conf

  • DOI
    10.1109/TENCON.2008.4766684
  • Filename
    4766684