• DocumentCode
    2529761
  • Title

    The effect of removal of loop back on the reliability of the restored paths provided by p-cycles

  • Author

    Asthana, Rachna ; Singh, Yatindra Nath

  • Author_Institution
    Dept. of Electron. Eng., Harcourt Butler Technol. Inst., Kanpur
  • fYear
    2008
  • fDate
    19-21 Nov. 2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The p-cycles have been proved to be very effective technique of span protection due to its capacity efficiency and restoration speed. However, in most of the restored paths which are provided after the event of failure, many nodes and links are repeated. This repetition results in loop backs in the restored paths. These loop backs are totally undesirable and do not serve any purpose. In this paper we have performed a study to find out the effect of removal of loop back on the reliability of the restored paths. We have developed models for calculation of the reliability before and after removal of loop back. The reliability of the restored paths has been compared before and after the removal of loop backs. The results show considerable improvement in the reliability of the paths after loop back removal.
  • Keywords
    graph theory; optical fibre networks; telecommunication network reliability; graph theory; loop back removal effect; p-cycle; restored path reliability; span protection; Distributed algorithms; Heuristic algorithms; Integer linear programming; Mesh networks; NP-hard problem; Protection; Protocols; Reliability engineering; Routing; Telecommunication traffic;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    TENCON 2008 - 2008 IEEE Region 10 Conference
  • Conference_Location
    Hyderabad
  • Print_ISBN
    978-1-4244-2408-5
  • Electronic_ISBN
    978-1-4244-2409-2
  • Type

    conf

  • DOI
    10.1109/TENCON.2008.4766687
  • Filename
    4766687