Title :
On Relocation of Hopping Sensors for Rugged Terrains
Author :
Kim, Moonseong ; Mutka, Matt W. ; Choo, Hyunseung
Author_Institution :
Dept. of Comput. Sci. & Eng., Michigan State Univ., East Lansing, MI, USA
Abstract :
When some sensors become power-exhausted in Wireless Sensor Networks (WSNs), mobile redundant sensors might be moved to cover the sensing holes created by the failed sensors. Within rugged terrains where wheeled sensors are unsuitable, other types of mobile sensors, such as hopping sensors, are needed. In this paper, we address the problem of relocating hopping sensors to the detected sensing holes. In fact, the state of these areas - harsh terrains, disaster areas, etc. - may be irregular; however, recent literature only considered movement of hopping sensors within regular areas. Hence, this paper analyzes cases that consider the level of irregularity and the number of hops required. The major contributions of this paper are a definition of the level of regularity of an area and an analysis of the performance of the proposed reliability-based schemes according to total movement and lifetime of sensors. Simulation results show that the proposed schemes outperform the shortest path-based scheme under rugged terrains.
Keywords :
telecommunication network reliability; wireless sensor networks; area regularity; detected sensing hole; failed sensor; hopping sensor; mobile redundant sensor; reliability-based scheme; rugged terrain; sensor lifetime; sensor movement; shortest path-based scheme; wireless sensor network; Biosensors; Gaussian distribution; Image sensors; Intelligent sensors; Performance analysis; Power engineering and energy; Prototypes; Robot sensing systems; Sensor phenomena and characterization; Wireless sensor networks; Wireless Sensor Networks (WSNs); hopping sensors; mobile sensors; rugged terrains; sensing holes; sensor relocation;
Conference_Titel :
Computational Science and Its Applications (ICCSA), 2010 International Conference on
Conference_Location :
Fukuoka
Print_ISBN :
978-0-7695-3999-7
Electronic_ISBN :
978-1-4244-6462-3
DOI :
10.1109/ICCSA.2010.53